A new design for built-in self-test of 5GHz low noise amplifiers
Jee-Youl Ryu, B.C. Kim · 2004
This paper presents a new low-cost built-in self-test (BIST) circuit for 5GHz low noise amplifier (LNA). The BIST circuit is designed for system-on-chip (SOC) transceiver environment. The proposed BIST circuit measures the LNA specifications such as input impedance, voltage gain, noise figure, and input return loss all in a single SoC environment.