A dynamic element matching approach to ADC testing
Beatriz Olleta, Degang J. Chen, R.L. Geiger · 2003
A dynamic element matching approach to ADC testing is presented. With this technique a highly nonideal DAC is used to generate an excitation for the DUT. Dynamic element matching is used to create a statically precise excitation from imprecise components. Simulation results show this approach can be used to accurately measure the performance of an ADC. This technique offers potential for use in both production test and BIST environments.