Fault orientated test and fault simulation of mixed signal integrated circuits
Ian M. Bell, K.R. Eckersall, S.J. Spinks, Gaynor E. Taylor · 2002
This paper considers the implications of structural test for analog and mixed signal (analog and digital) circuits and describes fault simulation software suitable for investigating a variety of test methods. Results from simulation investigations of dynamic supply current test are presented and compared with results obtained for real circuits. In both cases the results indicate increased fault coverage and reliability benefits. The dynamic supply current monitoring equipment used to implement the hardware test is described.