Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction
Yoshinobu Higami, Seiji Kajihara, S. Kobayashi, Yuzo Takamatsu · 2005
In this paper, we propose techniques for finding Xs in test sequences for sequential circuits. Also we show two applications that utilize the obtained test sequences with Xs: reduction of the power during test and test compaction.