Timing analysis and delay-fault test generation using path-recursive functions
Patrick C. McGeer, A. Saldanha, Paul R. Stephan, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli · 2002
The authors introduce an efficient method for generating the functional forms of path analysis problems. They demonstrate that the resulting function is linear in the size of the circuit. The functions are then tested for satisfiability either using a Boolean network satisfiability algorithm suggested by T. Larrabee (1989) or through the construction of BDDs. The effectiveness of the proposed approach is shown for timing analysis and robust path delay-fault test generation. This method also holds promise for both static and dynamic hazard analysis, and for test generation using all other delay-fault models, tau -irredundant fault models, and stuck-open fault models.>