21-bit precision and high-speed DC measurement system
Tadaaki SATOH, Akira Takagi, Masami Kita, 克彦 白川, Shimpei Takeshita · International Test Conference · 1984
Continuing trends in A/D and D/A converters for increased resolution and accuracy call for higher linearity and higher speed to test them. This paper introduces a DC measurement system specifically developed to fulfill these needs, having a precision voltmeter with 21-bit resolution, a measurement time of 1 ms, a linearity of ±1.5 ppm, and having precision voltage sources with 21-bit resolution, a settling time of 500 µs, and a linearity of ±4 ppm.