Testability measure and analysis
P.V.C.V. Reddy · 2003
Testability is a major concern in the design of VLSICs and ASICs. Testing can be simplified and made more effective if design for testability (DFT) techniques are incorporated into the design. There are many methods to analyze, measure, and evaluate the effectiveness of a DFT technique. A review of some of the widely used methods for measuring testability is presented.>