Reducing test-data volume and test-power simultaneously in LFSR reseeding-based compression environment
Weizheng Wang, Jishun Kuang, Zhiqiang You, Peng Liu · Journal of Semiconductors · 2011
This paper presents a new test scheme based on scan block encoding in a linear feedback shift register (LFSR) reseeding-based compression environment. Meanwhile, our paper also introduces a novel algorithm of scan-block clustering. The main contribution of this paper is a flexible test-application framework that achieves significant reductions in switching activity during scan shift and the number of specified bits that need to be generated via LFSR reseeding. Thus, it can significantly reduce the test power and test data volume. Experimental results using Mintest test set on the larger ISCAS'89 benchmarks show that the proposed method reduces the switching activity significantly by 72%–94% and provides a best possible test compression of 74%–94% with little hardware overhead.