Design of a Noise Measurement Syste for CMOS Transistors
Jesse Richmond · 2005
One of the fundamental limitations on all analog electronics circuits is the noise generated by the individual transistors. This project is a design of a system to allow laboratory measurements of the noise output by MOSFET transistors, of either N-channel or P-channel devices. The system currently extends frequency response to roughly 10 MHz with the possibility of a higher bandwidth amplifier easily extending this much farther. In addition, the system allows the tester to easily and accurately set the bias current flowing in the test transistor, helping to show the effects of changing the transcond uctance.