MEASURING C PROGRAM COVERAGE BASED ON BINARY DECISION DIAGRAMS
Shiliang, XuBaowen, ChenLin · Acta Scientiarum Naturalium Universitatis Sunyatseni · 2005
Test coverage analysis is a structural testing technique, which helps to evaluate the sufficiency of software testing. This letter presents two test generation algorithms based on binary decision diagrams to produce tests for the Multiple-Condition Criterion(M-CC) and the Modified Condition/Decision Criterion(MC/DC), and describes the design of the C program Coverage Measurement Tool (CCMT), which can record dynamic behaviors of C programs and quantify test coverage.