A 1Mb CMOS DRAM with design-for-test functions
Joseph Neal, Brian M. Holland, Satoshi Inoue, Wah Kit Loh, H. McAdams, Ken Poteet · 1986
A mask programmable 1Mb CMOS DRAM family has been developed featuring design-for-test functions which allow the memory to reconfigured as an 8b parallel 128Kb organization to reduce test time. With a 1μm twin-well CMOS technology and a contactless trench cell, the chip measures 49mm2.