Application-specific low-voltage current amplifier for system-on-chip I/sub DDQ/ test
S. Dragic, Martin Margala · 2003
A novel topology of a low-voltage, low-power application-specific amplifier design is presented in this paper. The amplifier is designed as a built-in-self-test (BIST) on-chip circuitry for power supply current monitoring, and could be implemented with analog, digital or mixed-signal cores in system-on-chip (SOC) applications. The architecture is suitable for high frequency I/sub DDQ/ test. A 1.2 V high-frequency current amplifier is developed as a central part of the BIST structure. With sensitivity of less than 200 nA, the amplifier achieves a gain-bandwidth product of 7 GHz, a low frequency current gain of 48 dB, high linearity for an input current range of /spl plusmn/15 /spl mu/A and power consumption of 5.2 mW. The current amplifier has been implemented in 0.13 /spl mu/m CMOS technology with a 1.2 V power supply.