Current signatures [VLSI circuit testing]
Anne Gattiker, Wojciech P. Maly · 2002
In this paper we demonstrate that performing I/sub DDQ/ testing against a single threshold current value does not make sense. In place of the single current threshold we propose the "current signature". A die's current signature takes into account the relative measured level of current on all applied I/sub DDQ/ vectors. Preliminary results of current signature applications are discussed as well.