A necessary and sufficient condition for the testability of hybrid circuits
R. Liu, Lang Tong, L. Zhang · 2003
A unified theory of testing for general systems in a system theoretic setting is presented. It can be applied to digital, analog, and analog/digital hybrid systems. The theory is compared with known results for the classical and nonclassical faults of logic circuits. In the latter case, a maximum length for the test sequences is given for the general case of nonclassical faults. An illustrative example of a nonlinear analog/digital hybrid system is presented.>