Automatic linearity (IP3) test with built-in pattern generator and analyzer
Fa Foster Dai, Charles E. Stroud, Dayu Yang, Shuying Qi · 2005
We present a built-in self-test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. Of particular interest, and a main contribution of This work, is the BIST-based hardware implementation and measurement of amplifier linearity (IP3) test using DDS. The approach described in This work has been implemented in Verilog and synthesized into FPGAs where it was used for functional testing and compared to simulation results.