An algebraic approach for test generation in iterative logic networks
M.A. Seghrouchni, Mohsine Eleuldj · 2001
This paper deals with a generalisation of test concepts for iterative logic networks. We present an algebraic approach for test generation in iterative logic networks. The generated test is under the stuck-at fault model [Feng 81b] and the functional fault model [Eleu 88]. Three types of tests are defined : the U-test, NU-test and M-test.