Power-down structures for BIST
P.S. Levy · 2002
The author discusses how power-down test structures use a separate test power supply to allow the associated test circuitry to power-down when not being tested. These structures are specially designed to self-isolate from the host circuit when power is removed from Tvdd. This action will increase reliability by removing auxiliary circuit elements used for test from the host design during normal operation and decrease power consumption.>