Best Paper Award winners [ITC 2013 Paper Awards & ITC 2003 Most Significant Paper Award]
Zhaoyang Yu, D. Chen · International Test Conference · 2013
For the 2012 ITC Ned Kornfield Best Paper Award, the awards committee has chosen: Algorithm for Dramatically Improved Efficiency in ADC Linearity Test by Z. Yu, and D. Chen of lowa State University. For the Best Student Paper Award the committee has selected: Design Validation of RTL Circuits Using Evolutionary Swarm Intelligence M.Li, K. Gent, and M. Hsiao of Virginia Tech. For the 2003 ITC Most Significant Paper Award, the award committee has selected the following paper published at ITC 2003: A Case Study of IR-Drop in Structured At-Speed Testing by J. Saxena, K. Butler, V. Jayaram, S. Kundu, N. Arvind, P. Sreeprakash, Texas Instruments; and M. Hachinger, Siemens.