How to Tune the MTTF of a Fail-Silent System
Andreas Steininger, Christoph Scherrer · Defect and Fault Tolerance in VLSI and Nanotechnology Systems · 2001
This paper investigates the influence of parameter uncertainties on the MTTF of a dual redundant fail-silent embedded computer system. The proposed sensitivity analysis serves two purposes: First, it can be used to determine the permissible variances of parameter estimations performed for MTTF modeling. Second, it aids the system designer in assessing the impact of design decisions on the reliability of the system. In addition the impact of imperfect coverage of a startup-test in mission-oriented systems is discussed.