Methods and schemes of measuring the electric circuit resistance parameter value
A. I. Pukach, Roman-Andriy Ivantsiv, Vasyl Teslyuk · International Conference on Perspective Technologies and Methods in MEMS Design · 2010
A short analysis of the existing methods and schemes of measuring the unknown value of the electric circuit resistance parameter is conducted in present article. Their principle advantages and disadvantages are specified from the point of view of their prospective improvement aimed at solution of the problem of electric resistance measuring accuracy in MEMS technologies.