Verification Patterns for Rapid Embedded System Verification
Wei‐Tek Tsai, Feng Zhu, Lian Yu, Raymond A. Paul, Chun Xiao Fan · 2003
Test result verification is always a costly task for embedded system testing. This paper presents a systematic process to develop verification patterns and use these patterns to verify test results for state-based real-time/embedded systems. The verification patterns are organized into an object-oriented verification framework so that it can be adaptive to changes rapidly The verification patterns are reusable and thus can save significant time and effort in constructing the test execution infrastructure and generating test scripts. This paper describes a systematic process to perform rapid embedded system verification: 1) abstracts verification patterns based on requirement/scenario patterns analysis; 2) generates test cases/scripts from the verification patterns; 3) develops data acquisition component for raw data retrieval and event assemblers; 4) executes test scripts locally or remotely, and 5) collects and analyzes the test results. This process has been applied to a caralarm system and implantable device applications, which shows the framework developed can perform the verification tasks efficiently.