New test access for high resolution ΣΔ ADCs by using the noise transfer function evaluation
Daniela De Venuto · 2004
A new solution to improve the testability of high resolution /spl Sigma//spl Delta/ analogue to digital converters (/spl Sigma//spl Delta/ ADCs) using the quantizer input as a test node is described. Both the theory of the method and results from high level simulations for a 16 bit audio ADC example are presented. The analysis demonstrates the potential to reduce the computation overhead associated with test response analysis versus conventional techniques.