A BIST Structure for IP Multi-Slope A/D Converter Testing
Raja Maghrebi, Mohamed Masmoudi · 2003
Abstract—This paper proposes a static test approach suitable for built-in-self-test (BIST) of Analog-to-digital converter Intellectual Property (IP). Static parameters (INL, DNL, gain, offset) are tested without using test equipment. The proposed BIST structure is applicable for testing models of analog-to-digital converters up to 12bits of resolution. Comparison results with dynamic test equipment validates the proposed static test approach. Index Terms — Analog-Digital Conversion, Built-In Self-Test, Intellectual Property, Modeling. 1.