BIST Synthesis : An Approach to Resource Optimization under Test Time Constraints
Abdil Rashid Mohamed, Zebo Peng, Petru Eles · 2001
This paper describes an approach to optimize BIST resource usage for system on chip under testing time constraints. A symbolic testability analysis technique is used to analyze testability of the design for pseudorandom BIST. The testability analysis results are used to guide high-level synthesis of system on chip blocks with BIST mechanisms. Finally, BIST resources are optimized to comply with test time constraints. Key words: BIST, testing time, symbolic testability analysis, and high-level BIST synthesis.