Testability guided BIST technique
Yu Fang, Alexander Albicki · 2002
In this paper, a novel Built-In-Self-Test (BIST) scheme is presented. It transforms the circuit into an easily testable entity under the guidance of random pattern testability analysis, and subsequently performs pseudo-random test pattern generation and signature analysis. Experiments on ISCAS85 benchmark circuits show that this scheme helps to achieve higher efficiency in random pattern testing.