Sequential Logic Test
Alexander Miczo · 2003
In this chapter we create tests for sequential circuits where the outputs are a function not just of present inputs but of past inputs as well. Our objective is to create a sensitized path from the point where a fault occurs to an observable output. There are now new factors that must be considered. A sensitized path must be propagated not only through logic operators, but also through an entirely new dimension—time. The time dimension may be discrete, as in synchronous logic, or it may be continuous, as in asynchronous logic.