A new redundancy analysis algorithm using one side pivot
Joo-Young Kim, Keewon Cho, Woosung Lee, Sungho Kang · 2014
It is important to test the memory and repair faults for improving the memory yield. Many redundancy analysis (RA) algorithms have been developed to repair the memory faults. However, it is difficult to achieve high repair rate and fast analysis speed. The previous RA algorithms do not achieve both high repair rate and fast analysis speed. To overcome this problem, a new RA algorithm called one side pivot (OSP) is proposed. Using the property of pivot fault and its repair priority, the analysis time to find a solution can be reduced. The experimental results show that the proposed algorithm is efficient in terms of repair rate and analysis speed.