Test Derivation Through Critical Path Transitions
李伟东, 魏道政 · 1992
In this paper, a new technique called test derivation is presented,aiming at the promotion of the random testing efficiency for combinational circuits,Combined with a fault simulator based on critical path tracing method,we introduce the concept of seed test derivation and attempt to generate a group of new tests from the seed test by means of critical path transition.The neccessary conditions and efficient algorithms are proposed to guarantee the usefulness of the newly derived tests and the correctness of the critical path transitions.Also,examples are given to demonstrate the effectiveness of the technique.