Column-Matching Based BIST Design Method
Petr Fišer, Jan Hlavicka · 2002
A new method of test-per-clock BIST design for combinational circuits is proposed. The fundamental problem of matching the PRPG outputs with the required test patterns is solved as a general design problem in the field of combinational logic. A test set generated by an ATPG is compared with the PRPG generated sequence. The solution is based on a novel search algorithm, which identifies the best matches between the pairs of columns of the two sets.