Design and verification of built-in-self-test (BIST) for RF, and Microwave applications
Bilal Elkassir, Sidina Wane · European Microwave Integrated Circuit Conference · 2011
This paper presents RF and Microwave BIST system for reconfigurability of on-chip function blocks. Design of BIST for on-chip functions is demonstrated based on design of scalable LNA gain (with digitally controlled attenuators), programmable automatic oscillation amplitude control of PLL reference VCOs and dynamic EVM estimation of IQ systems. In all aforementioned applications impacts of BIST circuits on system performances are evaluated based on simulation and experimental verifications.