Testing of domino and latched domino circuits using current sensors
Michael W. Roberts, A.M. Reipold · 2002
Several types of faults that can occur in domino and latched domino (LDomino) logic are analyzed. The faults considered include: stuck-open, stuck-close, bridging and gate substrate faults. A current monitor that detects these faults is proposed. The monitor adds very little overhead when appended to a complex logic function implemented in domino or LDomino.>