A low capture power test generation method using capture safe test vectors
Atsushi Hirai, Yukari Yamauchi, Toshinori Hosokawa, Masayuki Arai · 2015
In this paper, we propose a new low capture power test generation method based on fault simulation to reduce the number of unsafe faults. The method uses capture-safe test vectors in an initial test set to generate new test vectors. Our experimental results show that the use of this method reduces the number of unsafe faults by 94% on average, and while requiring less test generation time compared with the conventional low capture power test generation method.