Test automation for NFC ICs using Jenkins and NUnit
Stephan Puri-Jobi · 2015
This article gives a detailed overview of the setup of a test environment which is used for Near Field Communication (NFC) Integrated Circuits (ICs) at ams AG. The test environment is used for the verification and validation of the NFC ICs, as well as for pre-certification test runs, and is useable in two ways: (1) manual execution for every developer to be able to run tests on their desk before committing code changes and to reproduce failing test cases and (2) automated execution which is necessary for the Continuous Integration (CI) approach which is followed during development and to ensure that all tests are run against the Device Under Test (DUT). First a description of the system which shall be tested is given. Afterwards the used tools and methods to execute the various test benches are discussed. The hurdles which showed up during the process of setting up the environment for manual as well as automated execution are explained and the used solution is discussed.