Testing interconnects for noise and skew in gigahertz SoCs
Amir Attarha, Mehrdad Nourani · 2002
Voltage distortion (noise) and delay violations (skew) contribute to the signal integrity loss and ultimately functional error, performance degradation and reliability problems. We present a BIST-based test methodology that includes two special cells to detect and measure noise and skew occurring on the interconnects of the gigahertz system-on-chips.