Lumped passive circuits for 5GHz embedded test of RF SoCs
Jangsup Yoon, William R. Eisenstadt · 2004
Many companies have been trying to integrate the entire WLAN system on a SoC. Such a high level integration calls for the development of embedded self tests for the SoC. This WLAN embedded self test requires 5 GHz directional couplers, baluns, and dividers, which are presented in this work. Lumped passive 5 GHz ICs were developed to demonstrate these compact test devices. Measurement results show excellent agreement with simulation for the integrated 5 GHz coupler, balun and divider designs.