Detection of CMOS bridging faults using minimal stuck-at fault test sets
Nabeel Ijaz, James F. Frenzel · NASA Technical Reports Server (NASA) · 1993
The performance of minimal stuck-at fault test sets at detecting bridging faults are evaluated. New functional models of circuit primitives are presented which allow accurate representation of bridging faults under switch-level simulation. The effectiveness of the patterns is evaluated using both voltage and current testing.