A broadcast-based test scheme for reducing test size and application time
Jiann-Chyi Rau, Jun-Yi Chang, Chien-Shiun Chen · 2006
We present efficient method for reducing test application time by broadcasting test configuration. We compare our method based on single, multiple, 1-1 in-order mapping, even distribution, nearest signal probability matching, and in-order pseudo-exhaustive method. The results of our experiments indicate that our method reducing the test pattern number and the test application time by running the ATPG tool provided by SIS.