Efficient UBIST for RAMs
M. Nicolaidis · 2002
First presents a self-checking implementation for RAMs. Then, the unified BIST technique is applied to this scheme. It merges self-checking and BIST techniques and allows a high fault coverage for all tests needed for integrated circuits, e.g. off-line test (manufacturing and maintenance test) and periodic as well as concurrent on-line testing. In order to preserve the RAM contents for periodic on-line testing the authors employ a transparent BIST implementation.>