Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily
Tomasz Golonek, Damian E. Grzechca, Jerzy Rutkowski · ICSES 2010 International Conference on Signals and Electronic Circuits · 2010
This paper describes the technique dedicated to an analog integrated circuit testing by means of supply current monitoring. The minimal set of test points, that allows to achieve the highest possible fault coverage, is determined with the use of genetic algorithm. Thanks to the proposed dynamic scheme of phenotype coding, the optimization process is more efficient than for a standard, static genotype structure realization.