A fault tolerant response analyzer with self-error-correction capability
Yuki Fukazawa, Hideyuki Ichihara, Tomoo Inoue · 2015
Reliable built-in self-test (Reliable BIST) scheme equips to be tolerant of faults, which occur in embedded BIST circuits. To realize reliable BIST, it is required to recover itself from transient errors of its embedded BIST circuits. In this paper, we propose a self-error-correctable response analyzer (RA) for a reliable BIST scheme. Experimental results show that test-reliability of SECRA is superior to TMR MISRs on the assumption that transient faults occur in RA during testing CUTs.