Real-Time BIST Detector for BGA Faults in Field Programmable Gate Arrays (FPGAs)
James P. Hofmeister, Justin B. Judkins, Edgar Ortiz, Douglas L. Goodman, Pradeep Lall · 2006
Abstract- In this paper we introduce a solderjoint built-in-self-test (SJ BIST) for detecting high-resistance and intermittent faults in operational, fully programmed field programmable gate arrays (FPGAs). The approach is simple to implement, offers a method to detect high-resistance faults that result from damaged solder joints, and uses a maximum of one small capacitor externally connected to each selected test pin or each group of two test pins.