Lower estimate of the length of the complete test in the basis {x|y}

Yu. V. Borodina · Moscow University Mathematics Bulletin · 2015

It is proved that the length of the complete test is not less than n + 1 (n ≥; 2) for any circuit realizing the function x1 V x2 V... V x n in the “Sheffer stroke” basis with possible constant faults of type “1.” An example of such circuit is constructed so that the length of the complete test is exactly n + 1.

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