A fault-driven, comprehensive redundancy algorithm for repair of dynamic RAMs
John R. Day · International Test Conference · 1984
This paper describes a fault-driven algorithm that generates all possible repair solutions for a given bit failure pattern in a redundant RAM. Benefits of this approach include the ability to select repair solutions based on user-defined preferences (fewest total elements invoked, fewest rows invoked, etc.). Perhaps the greatest advantage of this algorithm is its capacity to generate solutions for theoretically repairable dice that would be deemed unrepairable by existing algorithms.