Test generation for capacitance and inductance induced noise on interconnects in vlsi logic
Melvin A. Breuer, Sandeep K. Gupta, Arani Sinha · 2006
Advancements in integrated circuit technologies have made it possible to reduce physical dimensions of devices and interconnects, increase switching speeds of devices, and reduce power supply voltages. As a result, capacitance and inductance effects can create severe on-chip noise on VLSI interconnects. Noise such as crosstalk glitch and delay, overshoots, and undershoots, can lead to functional errors. In this dissertation I have studied (i) test generation methods for capacitance induced delay for enhanced efficiency and accuracy, and (ii) inductance induced noise from a test and validation perspective. We have used hazards and transitions to extend logic conditions for propagating faults. We have employed new timing conditions for pruning search spaces during test generation. We have introduced a relaxed criterion for fault detection based on timing. Further, we have proposed different algebras for test generation. We have implemented test generators in software based on 9-valued and 57-valued algebras. The algebras were developed in light of timing based test generation. We have developed a methodology for primary input assignments to control signal arrival times on circuit lines. With respect to standard benchmark circuits, our results are superior to previous findings. We have also studied characteristics of oscillatory noise, and inductance induced crosstalk noise and delay. We have shown that inductance aggravates noise. We have shown that process variation and spot defects can significantly increase noise. To facilitate test generation, we have derived analytical expressions for the magnitude and time of occurrence of oscillatory noise as a function of rise and fall time. We have shown that the value of static signals on interconnects adjacent to the aggressor and victim lines can impact the magnitude of noise and delay. Finally, we have discussed the impact of these observations on test and validation of inductance induced noise.