DV-TSE: Difference Vector Based Test Set Embedding.
Maciej Bellos, Xrysovalantis Kavousianos, Dimitris Nikolos, Dimitri Kagaris · 2003
In this paper we present a new test set embedding method for test-per-clock BIST schemes. The method works efficiently with fully specified as well as partially specified test sets and requires a number of clock cycles equal to the size of the test set. The resulting test pattern generation mechanism (TPG) compares favourably in terms of area implementation and test application time to already known approaches.