Control system of a multifunctional tester for electronically protected documents
M. Neska, A. Majcher, J. Przybylski · Pomiary, Automatyka, Robotyka · 2013
Introduction of electronic protection into documents makes it necessary for the documents to undergo multicriteria tests, and results in a growing need for the development of spe- cialised testers, an example of which can be constituted by a multifunctional testing device. The article presents a control system for a tester which realises the following tests: stamping, writing in, abrasion in an electronically protected document. The authors also describe the structure of hardware used and the structure of tests the devices can realise. Additionally, behav- ioural analysis with the use of UML activity diagrams is presented as well as technical parameters of the control system developed and its possible areas of application in a series of testing devices. through tester), one sided and two sided changeable quasi- static and low-cycle bending (two-sided bending tester), two sided oscillatory symmetric and asymmetric change- able quasi-static and low-cycle twisting (alternate twisting tester). The multifunctional tester generates three types of impact connected with the manual filling in of the docu- ment and abrasion. The loads are realised with the use of a dedicated triaxial spherical manipulator system. One of the main assumptions at the time of designing the series of testers was that the devices needed to remain unified, and hence a universal control system had to be developed. The main components of the aforementioned system include the following: a set point module with an ascribed operator panel, and a regulation module consti- tuted by a PLC controller allowing for an easy and fast extension of the system. Functions of the executive set and the measuring element are played by dedicated ele- ments whose selection is connected with requirements towards a given testing device. The developed control system is cheap, universal, easy to be extended and modi- fied, which means that it can be used for the entire series of testing devices.