Faults in digital circuits
Stanley L. Hurst · Institution of Engineering and Technology eBooks · 1998
In considering the techniques that may be used for digital circuit testing, two distinct philosophies may be found, namely: (a) to undertake a series of functional tests and check for the correct (fault free) 0 or 1 output response(s); (b) to consider the possible faults that may occur within the circuit, and then to apply a series of tests which are specifically formulated to check whether each of these faults is present or not.